منابع مشابه
Testing complementary pass-transistor logic circuits
Abstruct Behavior of basic and complex logic gates using complementary pass-transistor logic (CPL) under various single-stuck faults are investigated. The result shows that all stuck-on faults in the basic CPL gates can be detected by current monitoring, but no logic monitoring is possible. Similarly all bridging faults between gate and source of basic CPL gates can be detected only by current ...
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ژورنال
عنوان ژورنال: American Journal of Physics
سال: 1961
ISSN: 0002-9505,1943-2909
DOI: 10.1119/1.1937610